A study on the crystallization behavior and electrical properties of BST thin films by self-buffering process

Journal of the Korean Physical Society

Volumn 35, Issue SUPPL. 2, 1999, Pages

  Kil, Deok Sin ^a   Lee, Byung Il ^a   Joo, Seung Ki ^a  

^a Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000269361     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (6)

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3. Deok-Sin Kil, Byung-Il Lee and Seung-Ki Joo, Mat. Res. Soc. Symp. Proc. 493, 39 (1998).
4. Deok-Sin Kil, Byung-Il Lee and Seung-Ki Joo, J. Korean Phys. Soc. 32, S1425 (1998).
5. Chii-Ming Wu and Tai-Bor Wu, Jpn. J. Appl. Phys. 36, Part. 1, No. 3A, 1164 (1997).
6. G. W. Dietz, M. Schumacher, R. Waser, S, K. Streiffer, C. Basceri and A. I. Kingon, J. Appl. Phys. 82, 2359 (1997).