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Volumn 69, Issue 25, 1996, Pages 3899-3901
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Oxygen gettering and precipitation at MeV Si+ ion implantation induced damage in silicon
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000268095
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.117563 Document Type: Article |
Times cited : (34)
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References (13)
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