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Volumn 69, Issue 25, 1996, Pages 3899-3901

Oxygen gettering and precipitation at MeV Si+ ion implantation induced damage in silicon

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000268095     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117563     Document Type: Article
Times cited : (34)

References (13)
  • 5
    • 5544251516 scopus 로고
    • Ph.D. thesis, North Carolina State University
    • A. Agarwal, Ph.D. thesis, North Carolina State University, 1995.
    • (1995)
    • Agarwal, A.1
  • 9
    • 5544300606 scopus 로고
    • edited by W. Murray Bullis and L. C. Kimerling The Electrochemical Society, Pennington, NJ
    • J. M. Andrews, in Defects in Silicon, edited by W. Murray Bullis and L. C. Kimerling (The Electrochemical Society, Pennington, NJ, 1993), p. 143.
    • (1993) Defects in Silicon , pp. 143
    • Andrews, J.M.1
  • 10
    • 0006235897 scopus 로고
    • edited by J. W. Mikkelsen, Jr., S. J. Pearton, J. W. Corbett, and S. J. Pennycook Mater. Res. Soc., Pittsburgh, PA
    • J. W. Mikkelsen, Jr., in Oxygen, Carbon, Hydrogen and Nitrogen in Crystalline Silicon, edited by J. W. Mikkelsen, Jr., S. J. Pearton, J. W. Corbett, and S. J. Pennycook (Mater. Res. Soc., Pittsburgh, PA, 1986), p. 19.
    • (1986) Oxygen, Carbon, Hydrogen and Nitrogen in Crystalline Silicon , pp. 19
    • Mikkelsen Jr., J.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.