Detection of picosecond electrical transients in a scanning tunneling microscope

Physica B: Condensed Matter

Volumn 218, Issue 1-4, 1996, Pages 294-296

  Groeneveld, R H M ^a   Rasing, Th ^a   Kaufmann, L M F ^c   Smalbrugge, E ^c   Wolter, J H ^c   Melloch, M R ^b   Van Kempen, H ^a  

^a RADBOUD UNIVERSITY NIJMEGEN   (Netherlands)

^b PURDUE UNIVERSITY   (United States)

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC RESISTANCE; MICROSCOPES; MOLECULAR BEAM EPITAXY; OHMIC CONTACTS; OPTICAL SWITCHES; OPTOELECTRONIC DEVICES; PHOTOLITHOGRAPHY; SPURIOUS SIGNAL NOISE;

CLEAVAGE METHOD; CONTACT RESISTANCE; COPLANAR STRIPLINE; MICRONS; OPTOELECTRONIC SWITCH; PICOSECOND ELECTRICAL TRANSIENTS; SIGNAL DAMPING; TUNNELING TIP CURRENT;

SCANNING TUNNELING MICROSCOPY;

EID: 0030083767     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-4526(95)00618-4     Document Type: Article

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