A lateral modulation technique for simultaneous friction and topography measurements with the atomic force microscope

Review of Scientific Instruments

Volumn 65, Issue 9, 1994, Pages 2870-2873

  Goddenhenrich T ^a   Muller S ^a   Heiden, C ^a  

^a JUSTUS LIEBIG UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36449004405     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1144630     Document Type: Article

References (12)

1. Atoms and Molecules in High Fields and Temperature
2. Fundamentals of Friction: Macroscopic and Microscopic Processes