Cross-sectional high resolution electron microscopy of Zn+ implanted and low-power pulsed-laser annealed GaAs

Applied Physics Letters

Volumn 69, Issue 26, 1996, Pages 4072-4074

  Vitali, G ^a   Zollo, G ^a,d   Pizzuto, C ^a   Manno, D ^b   Kalitzova, M ^c   Rossi, M ^a  

^a SAPIENZA UNIVERSITY OF ROME   (Italy)

^b UNIVERSITY OF SALENTO   (Italy)

^c INSTITUTE OF SOLID STATE PHYSICS   (Bulgaria)

^d Trisaia Research Center   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000236997     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117822     Document Type: Article

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