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Volumn 80, Issue 12, 1996, Pages 6699-6705

Morphology and microstructure of epitaxial Cu(0017) films grown by primary ion deposition on Si and Ge substrates

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000215832     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363795     Document Type: Article
Times cited : (23)

References (31)
  • 1
    • 0003905979 scopus 로고
    • edited by D. T. J. Hurle Elsevier, New York
    • J. E. Greene in Handbook of Crystal Growth, edited by D. T. J. Hurle (Elsevier, New York, 1993), Vol. 1.
    • (1993) Handbook of Crystal Growth , vol.1
    • Greene, J.E.1
  • 13
    • 36549096467 scopus 로고
    • Epitaxial growth of Cu(001) on Si(001) has also been observed following rf bias sputtering: the in-plane orientation of the Cu(001) films was not reported; see T. Ohmi, T. Saitu, T. Shibata, and T. Nitta, Appl. Phys. Lett. 52, 2236 (1988).
    • (1988) Appl. Phys. Lett. , vol.52 , pp. 2236
    • Ohmi, T.1    Saitu, T.2    Shibata, T.3    Nitta, T.4
  • 19
    • 0027914986 scopus 로고
    • Pole figure data are a stereographic projections of the diffracted intensities at a fixed Bragg angle; see, for example, David B. Knorr, Mater. Res. Soc. Symp. Proc. 309, 75 (1993).
    • (1993) Mater. Res. Soc. Symp. Proc. , vol.309 , pp. 75
    • Knorr, D.B.1
  • 24
    • 0001878810 scopus 로고
    • edited by R. W. Cahn and P. Haasen North-Holland, Amsterdam
    • H. J. Wollenberger, in Physical Metallurgy, Part II, edited by R. W. Cahn and P. Haasen (North-Holland, Amsterdam, 1983), pp. 1159 and 1189.
    • (1983) Physical Metallurgy , Issue.2 PART , pp. 1159
    • Wollenberger, H.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.