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6
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85037517497
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note
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The wafers were processed in parallel to minimize any variations in performance arising from differences in device fabrication.
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7
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36449000038
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J. Faist, F. Capasso, C. Sirtori, D. L. Sivco, A. L. Hutchinson, and A. Y. Cho, Appl. Phys. Lett. 66, 538 (1995).
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8
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85037495609
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note
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th has been measured.
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9
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0032166359
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C. Sirtori, F. Capasso, J. Faist, A. L. Hutchinson, D. L. Sivco, and A. Y. Cho, IEHE J. Quantum Electron. 34, 1722 (1998).
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10
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0032621306
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Gornik, E.6
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