High-resolution x-ray spectra measured using tantalum superconducting tunnel junctions

Applied Physics Letters

Volumn 72, Issue 25, 1998, Pages 3359-3361

  Verhoeve, P ^a   Rando, N ^a   Peacock, A ^a   Van Dordrecht, A ^a   Taylor, B G ^a   Goldie, D J ^b  

^a EUROPEAN SPACE AGENCY   (Netherlands)

^b OXFORD INSTRUMENTS PLASMA TECHNOLOGY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000692956     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121603     Document Type: Article

References (17)

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