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Volumn 61, Issue 5, 2000, Pages 3286-3296

X-ray-absorption spectroscopy and x-ray diffraction in discontinuous multilayers

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000106225     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.61.3286     Document Type: Article
Times cited : (6)

References (29)
  • 25
    • 0000293935 scopus 로고    scopus 로고
    • R. W. Hoffman, in Physics of Thin Films, edited by G. Hass and R. F. Thun (Academic Press, New York, 1966), Vol. 3, p. 211.
    • Physics of Thin Films , vol.3 , pp. 211
    • Hoffman, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.