Structural evolution and magnetic behavior of Co/Ag multilayers submitted to thermal annealing

Journal of Magnetism and Magnetic Materials

Volumn 188, Issue 1-2, 1998, Pages 17-29

  Flores, W H ^a   Teixeira, S R ^a   Geshev, J ^a   Da Cunha, J B M ^a   Schilling, P J ^b   Traverse, A ^c   Alves, M C Martins ^d  

^a FEDERAL UNIVERSITY OF RIO GRANDE DO SUL   (Brazil)

^b LOUISIANA STATE UNIVERSITY   (United States)

^c UNIVERSITÉ PARIS SACLAY   (France)

^d LABORATÓRIO NACIONAL DE LUZ SÍNCROTRON   (Brazil)

Author keywords

Magnetic properties; Multilayers; Thin films

Indexed keywords

ABSORPTION SPECTROSCOPY; ANNEALING; COBALT; INTERFACES (MATERIALS); MAGNETIC ANISOTROPY; MAGNETIC VARIABLES MEASUREMENT; MAGNETIZATION; MAGNETORESISTANCE; MULTILAYERS; SILVER; SURFACE ROUGHNESS; X RAY DIFFRACTION ANALYSIS;

X RAY ABSORPTION SPECTROSCOPY;

MAGNETIC THIN FILMS;

EID: 0032475267     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(98)00142-5     Document Type: Article

References (46)

1. A. Berkowitz, A.P. Young, J.R. Mitchell, S. Zang, M.J. Carey, F.E. Spada, F.T. Parder, A. Hutten, G. Thomas, Phys. Rev. Lett. 68 (1992) 3745.
2. J.G. Xiao, J.S. Jiang, C.L. Chien, Phys. Rev. Lett. 68 (1992) 3749.
3. B. Abeles, in: R. Wolfe (Ed.), Applied Solid State Science: Advances in Material and Device Research, Academic Press, New York, 1976, p. 1.
4. T.L. Hylton, Appl. Phys. Lett. 62 (1993) 2431.
5. A. Berkowitz, J.R. Mitchell, M.J. Carey, A.P. Young, D. Rao, A. Starr, S. Zhang, F.E. Spada, F.T. Parker, A. Hutten, G. Thomas, J. Appl. Phys. 73 (1993) 5320.
6. J.Q. Xiao, J.S. Jiang, C.L. Chien, Phys. Rev. B 46 (1992) 9266.
7. C.L. Chien, J. Appl. Phys. 69 (1991) 5267.
8. J.H. Du, Q. Li, L.C. Wang, H. Sang, S.Y. Zhang, Y.W. Du, D. Feng, J. Phys.: Condens. Matter 7 (1995) 9425.
9. J.A. Barnard, A. Waknis, M. Tan, E. Haftek, M.R. Parker, M.L. Watson, J. Magn. Magn. Mater. 114 (1992) 230.
10. S.H. Liou, S. Malhotra, Z.S. Shan, D.J. Sellmyer, S. Nafis, J.A. Woollam, C.P. Reed, R.J. De Angelis, G.M. Chow, J. Appl. Phys. 70 (1991) 5882.
11. T.L. Hylton, K.R. Coffey, M.A. Parker, J.K. Howard, Sci. 261 (1993) 1021.
12. L.F. Schelp, G. Tosin, M. Carara, M.N. Baibich, A.A. Gomes, J.E. Schmidt, Appl. Phys. Lett. 61 (1992) 1858.
13. A.D.C. Viegas, J. Geshev, L.F. Schelp, J.E. Schmidt, J. Appl. Phys. 82 (1997) 2466.
14. J.R. Regnard, C. Revenant-Brizard, B. Dieny, B. Mevel, J. Mimault, Mater. Res. Proc. 400 (1996) 329.
15. J.F. Gregg, S.M. Thompson, S.J. Dawson, K. Ounadjela, C.R. Staddon, J. Hamman, C. Fermon, G. Saux, K. O'Grady, Phys. Rev. B 49 (1994) 1065.
16. J.C. Lodder, P. de Haan, H. van Kranenburg, J. Magn. Magn. Mater. 128 (1993) 219.
17. D.J. Kubinski, H. Holloway, J. Appl. Phys. 77 (1995) 782.
18. A.D. Viegas, J. Geshev, L.S. Dorneles, J.E. Schmidt, M. Knobel, J. Appl. Phys. 82 (1997) 3047.
19. J.R. Regnard, J. Juanhuix, C. Revenant-Brizard, B. Dieny, B. Mevel, J. Mimault, O. Proux, Solid State Commun. 97 (1996) 419.
20. G. Tourillon, E. Dartyge, A. Fontaine, M. Lemonnier, F. Bartol, Phys. Lett. A 121 (1987) 251.
21. M.C. Correa, H. Tolentino, A. Craievich, C. Cusatis, Rev. Sci. Instrum. 63 (1992) 896.
22. F.W. Lytle, R.B. Greegor, D.R. Sandstrom, E.C. Marques, J. Wong, C.L. Spiro, G.P. Huffman, F.E. Huggins, NIM 226 (1984) 542.
23. A. Michalowicz, Logiciels pour la Chimie, vol. 102, Ed. Societé Française de Chimie, Paris, 1991.
24. C.L. Chien, J.Q. Xiao, J.S. Jiang, J. Appl. Phys. 73 (1993) 5309.
25. E.A. Brandes, Smithells Metals Reference Book, 6th ed., Butterworths, London, 1983.
26. L.I. Maisser, R. Glang (Eds.), Handbook of Thin Film Technology, McGraw-Hill, New York, 1983.
27. R.H. Marion, J.B. Cohen, Advances in X-Ray Analysis, vol. 15, Plenum Press, New York, 1975, p. 466.
28. C.S. Barret, T.B. Massalski, Structure of Metals, 3rd ed., McGraw-Hill, New York, 1966, p. 357.
29. H. Sato, O. Kitakami, T. Sakurai, Y. Shimada, Y. Otani, K. Fukamichi, J. Appl. Phys. 81 (1997) 1858.
30. J.J. Rehr, S.I. Zabinsky, R.C. Albers, Phys. Rev. Lett. 69 (1992) 3397.
31. J.J. Rehr, Jpn. J. Appl. Phys. 32 (1993) 8.
32. E.A.M. van Alphen, W.J.M. de Jonge, Phys. Rev. B 51 (13) (1995) 8182.
33. J.R. Childress, C.L. Chien, M. Nathan, Appl. Phys. Lett. 56 (1990) 95.
34. Y.X. Zhang, S.H. Liou, R.J. DeAngelis, K.W. Lee, C.P. Reed, A. Nazareth, J. Appl. Phys. 69 (1991) 5273.
35. J.R. Childress, C.L. Chien, J. Appl. Phys. 70 (1991) 5885.
36. F.E. Luborsky, J. Appl. Phys. 32 (1961) 171S.
37. B.J. Hickey, M.A. Howson, S.O. Musa, G.J. Tomka, B.D. Rainford, N. Wiser, J. Magn. Magn. Mater. 147 (1995) 253.
38. R. Gans, Ann. Phys. 15 (1932) 28.
39. J. Geshev, O. Popov, V. Masheva, M. Mikhov, J. Magn. Magn. Mater. 92 (1990) 185.
40. I. Joffe, R. Heuberger, Phil. Magn. 314 (1974) 1051.
41. J. Geshev, M. Mikhov, J. Magn. Magn. Mater. 104-107 (1992) 1569.
42. P.E. Kelly, K. O'Grady, P.I. Mayo, R.W. Chantrell, IEEE Trans. Magn. 2 (1989) 3881.
43. J.P. Jan, in: F. Seitz, D. Turnbull (Eds.), Solid State Physics. Advances in Research and Applications, vol. 5, Academic Press, New York, 1957, p. 1.
44. T.R. McGuire, R.I. Potter, IEEE Trans. Magn. 11 (1975) 1018.
45. E. Kolb, M. Mulloy, C. Dupas, M. Galtier, D. Renard, J.P. Renard, F. Trigui, E. Vélu, J. Magn. Magn. Mater. 148 (1995) 315.
46. P. Allia, M. Knobel, P. Tiberto, F. Vinai, Phys. Rev. B (1995) 15398.