The effect of surface nucleation on the evolution of crystalline microstructure during solid phase crystallization of amorphous Si films on SiO2

Applied Physics Letters

Volumn 71, Issue 21, 1997, Pages 3063-3065

  Ryu, Myung Kwan ^a   Hwang, Seok Min ^a   Kim, Tae Hoon ^a   Kim, Ki Bum ^a   Min, Seok Hong ^a  

^a Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000071075     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.119437     Document Type: Article

References (12)

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