A measurement of evanescent fields generating on metal thin films and Langmuir-Blodgett ultrathin films

Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals

Volumn 349, Issue , 2000, Pages 235-238

  Nakano, Takayuki ^a   Wakamatsu, Takashi ^b   Kobayashi, Hajime ^a   Kaneko, Futao ^a   Shinbo, Kazunari ^a   Kato, Keizo ^a   Kawakami, Takahiro ^a  

^a NIIGATA UNIVERSITY   (Japan)

^b IBARAKI NATIONAL COLLEGE OF TECHNOLOGY   (Japan)

Author keywords

Al thin films; ATR; C20 LB film; Evanescent field; Surface plasmon

Indexed keywords

ALUMINUM; CADMIUM COMPOUNDS; CALCULATIONS; ELECTROMAGNETIC FIELD MEASUREMENT; ELEMENTARY PARTICLES; GROUND STATE; LANGMUIR BLODGETT FILMS; LASER BEAMS; LUMINESCENCE; ORGANIC ACIDS; SUBSTRATES;

ATTENUATED TOTAL REFLECTION; EVANESCENT FIELD; LANGMUIR-BLODGETT ULTRATHIN FILMS; LUMINESCENT LIGHT; METAL THIN FILMS; SURFACE PLASMON;

ULTRATHIN FILMS;

EID: 0000046680     PISSN: 1058725X     EISSN: None     Source Type: Journal    
DOI: 10.1080/10587250008024908     Document Type: Article

References (4)

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3. M. Born and E. Wolf: Principles of Optics (Pergamon, Oxford, 1974).
4. T. Tsang, T. Srinivasan-Rao and J. Fischer: Phys. Rev. B, 8870-8878, 1991.