Attenuated total reflection properties and structures in squarylium LB films

Thin Solid Films

Volumn 284-285, Issue , 1996, Pages 417-419

  Kaneko, Futao ^a   Honda, Syosaku ^a   Fukami, Tetsuo ^a   Kato, Keizo ^a   Wakamatsu, Takashi ^b   Shinbo, Kazunari ^a   Kobayashi, Satoshi ^a  

^a NIIGATA UNIVERSITY   (Japan)

^b IBARAKI NATIONAL COLLEGE OF TECHNOLOGY   (Japan)

Author keywords

Attenuated total reflection property; Complex dielectric constant; Langmuir Blodgett (LB) structure; Squarylium LB film

Indexed keywords

ABSORPTION SPECTROSCOPY; ANISOTROPY; ANNEALING; DIELECTRIC MATERIALS; LASER BEAMS; LIGHT REFLECTION; LIGHT SENSITIVE MATERIALS; MOLECULAR STRUCTURE; MONOLAYERS; OPTICAL PROPERTIES; PERMITTIVITY; THIN FILMS;

ATTENUATED TOTAL REFLECTION PROPERTIES; CHROMOPHORES; PHOTOSENSITIVE SQUARYLIUM DYES; SQUARYLIUM LANGMUIR-BLODGETT FILMS;

LANGMUIR BLODGETT FILMS;

EID: 0030231874     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(95)08355-3     Document Type: Article

References (5)

1. See for example, Thin Solid Films, 242-244 (1994).
2. I. Pockrand, J.D. Swalen, R. Sant, A. Brillante and M.R. Philpott, J. Chem. Phys., 69 (9) (1978) 4001.
3. V.M. Agranovich and D.L. Mills, Surface Polaritons, North-Holland, 1982.
4. S. Honda, T. Wakamatsu, Y. Urano, K. Shinbo, K. Kato, F. Kaneko and S. Kobayashi, Proc. 1st Magneto-Electronics Int. Symp., Nagano, Japan, 1994, 10BpI-5, Shinshu University Press, Matsumoto, 1994, p. 241.
5. S. Honda, Y. Urano, K. Shinbo, K. Kato, F. Kaneko and S. Kobayashi, IEICE Japan Technical Report, CPM94-38, OME94-33, IEICE, Japan, 1994, p. 25.