Interfacial roughness effects on interlayer coupling in spin valves grown on different seed layers

Journal of Applied Physics

Volumn 87, Issue 6, 2000, Pages 3023-3026

  Parks, D C ^a   Chen, P J ^a   Egelhoff Jr , W F ^a   Gomez, Romel D ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000045024     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.372390     Document Type: Article

References (12)

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