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Volumn 15, Issue 4, 1997, Pages 967-970

Surface nitridation of silicon dioxide with a high density nitrogen plasma

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000018164     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589516     Document Type: Article
Times cited : (39)

References (14)
  • 8
    • 5844374070 scopus 로고    scopus 로고
    • Plasma and Materials Technology Inc., Chatsworth, CA 91311
    • PINNACLE Etch System, Plasma and Materials Technology Inc., Chatsworth, CA 91311.
    • PINNACLE Etch System
  • 11
    • 5844220691 scopus 로고    scopus 로고
    • Ltd., DCU, Glasnevin, Dublin 9, Ireland
    • Smart Probe Scientific Systems, Ltd., DCU, Glasnevin, Dublin 9, Ireland.
    • Smart Probe Scientific Systems
  • 12
    • 0003072237 scopus 로고
    • edited by R. H. Huddlestone and S. L. Leonard Academic, New York
    • F. F. Chen, in Plasma Diagnostic Techniques, edited by R. H. Huddlestone and S. L. Leonard (Academic, New York, 1965), pp. 113-199.
    • (1965) Plasma Diagnostic Techniques , pp. 113-199
    • Chen, F.F.1
  • 13
    • 5844233546 scopus 로고    scopus 로고
    • SIMS measurements performed by Evans East, Plainsboro, NJ 08520
    • SIMS measurements performed by Evans East, Plainsboro, NJ 08520.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.