Time resolved spectroscopy of ultrashort pulse laser generated x rays using von Hámos crystal spectroscopy

Review of Scientific Instruments

Volumn 75, Issue 10 II, 2004, Pages 3765-3767

  Shepherd, Ronnie ^a   Audebert, Patrick ^b   Booth, Rex ^a   Young, Bruce ^a   Bonlie, Jim ^a   Nelson, Don ^a   Shiromizu, Steve ^a   Price, Dwight ^a   Norman, Douglas ^a   Dunn, Jim ^a   Widmann, Klaus ^a   Springer, Paul ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b Centre National de la Recherche Scientifique   (France)

Author keywords

[No Author keywords available]

Indexed keywords

PLASMA TEMPERATURE; X-RAY CRYSTAL SPECTROSCOPY; X-RAY STREAK CAMERAS;

CRYSTALS; DIFFRACTIVE OPTICS; ELECTROMAGNETIC DISPERSION; FOCUSING; OPTICAL RESOLVING POWER; PLASMA DENSITY; SIGNAL TO NOISE RATIO; ULTRASHORT PULSES; X RAY CAMERAS;

X RAY SPECTROSCOPY;

EID: 9944264693     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1791751     Document Type: Conference Paper

References (5)

1. H. Greim, Plasma Spectroscopy (McGraw-Hill, New York, 1964).
2. F. B. Rosmej, J. Phys. B 28, L747 (1995).
3. Z. von Hámos, Z. Kristallogr. 101, 17 (1939).
4. C. R. Vane, M. S. Smith, and S. Raman, Oak Ridge National Laboratory Report No. ORNL/TM-10658, Oak Ridge Tennessee, 1988, pp. 6, 40.
5. P. Audebert, R. Shepherd, K. B. Fournier, O. Peyrusse, D. Price, R. W. Lee, P. Springer, J. C. Gauthier, and L. Klein, Phys. Rev. E 66, 066412 (2002).