Magnetic behaviors of MnxFe3-xO4 thin films grown by ferrite plating method

Thin Solid Films

Volumn 472, Issue 1-2, 2005, Pages 217-221

  Lee, Jeong Sik ^a   Ha, Tae Wook ^a   Jeong, Jung Hyun ^b   Kim, Ill Won ^c   Yi, Soung Soo ^d  

^a Kyungsung University   (South Korea)

^b Pukyong National University   (South Korea)

^c University of Ulsan   (South Korea)

^d Silla University   (South Korea)

Author keywords

Ferrite plating; Ferrite thin film; Magnetic properties and measurements; X ray diffraction

Indexed keywords

COERCIVE FORCE; FERRITE; FILM GROWTH; GRAIN SIZE AND SHAPE; MAGNETIC PROPERTIES; MAGNETIZATION; PLATING; POLYCRYSTALLINE MATERIALS; SUBSTRATES; X RAY DIFFRACTION ANALYSIS;

FERRITE PLATING; FERRITE THIN FILMS; MAGNETIC PROPERTIES AND MEASUREMENTS; MICROWAVE MONOLITHIC INTEGRATED CIRCUITS (MMIC);

THIN FILMS;

EID: 9944263441     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.07.001     Document Type: Article

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