Use of spherically bent crystals to diagnose wire array z pinches

Review of Scientific Instruments

Volumn 75, Issue 10 II, 2004, Pages 3681-3683

  Shelkovenko, T A ^a   Pikuz, S A ^a   Hammer, D A ^a   Ampleford, D J ^b   Bland, S N ^b   Bott, S C ^b   Chittenden, J P ^b   Lebedev, S V ^b  

^a Cornell University   (United States)

^b IMPERIAL COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DEBRIS SHIELDING; QUARTZ CRYSTALS; SPHERICALLY BENT CRYSTALS; WIRE ARRAY Z PINCHES;

CRYSTALS; ELECTRON ENERGY LEVELS; IMAGE ANALYSIS; MICA; MONOCHROMATORS; PLASMA DENSITY; QUARTZ; SPECTROMETERS;

WIRE;

EID: 9944247759     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1788864     Document Type: Conference Paper

References (8)

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7. T. A. Shelkovenko et al., Phys. Plasmas 8, 1305 (2001).
8. S. A. Pikuz et al., Phys. Rev. Lett. 89, 035003 (2002).