Quality-yield measure for production processes with very low fraction defective

International Journal of Production Research

Volumn 42, Issue 23, 2004, Pages 4909-4925

  Pearn, W L ^a   Chang, Y C ^a   Wu, Chien Wei ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CUSTOMER SATISFACTION; DECISION MAKING; DEFECTS; PERFORMANCE; PROBABILITY DENSITY FUNCTION; PROCESS CONTROL; QUALITY CONTROL;

PRODUCT LOSSES; PRODUCTION PROCESSES; QUALITY YIELD INDEX; STATISTICAL CONTROLS;

PRODUCTION;

EID: 9944242304     PISSN: 00207543     EISSN: None     Source Type: Journal    
DOI: 10.1080/00207540410001699417     Document Type: Article

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