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Volumn 272, Issue 1-4 SPEC. ISS., 2004, Pages 576-581
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Performance comparison between integrated 40 Gb/s EAM devices grown by selective area growth and butt-joint overgrowth
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Author keywords
A3. Butt joint; A3. Metalorganic vapor phase epitaxy (MOVPE); A3. Selective area growth (SAG); Al. Optical low coherence reflectometer (OLCR); B3. 40 Gb s Electro absorption modulator (eam)
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Indexed keywords
CHEMICAL VAPOR DEPOSITION;
CLADDING (COATING);
EPITAXIAL GROWTH;
METALLORGANIC VAPOR PHASE EPITAXY;
PHOTOLUMINESCENCE;
REFLECTION;
SEMICONDUCTING INDIUM GALLIUM ARSENIDE;
WAVEGUIDES;
WAVELENGTH DIVISION MULTIPLEXING;
40 GB/S ELECTRO ABSORPTION MODULATOR (EAM);
BUTT JOINT;
OPTICAL LOW COHERENCE REFLECTOMETER (OLCR);
SELECTIVE AREA GROWTH (SAG);
MODULATORS;
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EID: 9944236725
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2004.09.009 Document Type: Conference Paper |
Times cited : (4)
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References (6)
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