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Volumn 272, Issue 1-4 SPEC. ISS., 2004, Pages 576-581

Performance comparison between integrated 40 Gb/s EAM devices grown by selective area growth and butt-joint overgrowth

Author keywords

A3. Butt joint; A3. Metalorganic vapor phase epitaxy (MOVPE); A3. Selective area growth (SAG); Al. Optical low coherence reflectometer (OLCR); B3. 40 Gb s Electro absorption modulator (eam)

Indexed keywords

CHEMICAL VAPOR DEPOSITION; CLADDING (COATING); EPITAXIAL GROWTH; METALLORGANIC VAPOR PHASE EPITAXY; PHOTOLUMINESCENCE; REFLECTION; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; WAVEGUIDES; WAVELENGTH DIVISION MULTIPLEXING;

EID: 9944236725     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2004.09.009     Document Type: Conference Paper
Times cited : (4)

References (6)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.