X-ray spectroscopy with elliptical crystals and face-on framing cameras

Review of Scientific Instruments

Volumn 75, Issue 10 II, 2004, Pages 3762-3764

  Heeter, R F ^a   Emig, J A ^a   Fournier, K B ^a   Hansen, S B ^a   May, M J ^a   Young, B K F ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELLIPTICAL CRYSTALS; MICROCHANNEL PLATE DETECTORS; SPECTRAL RESOLUTION; X-RAY FRAMING CAMERAS (XRFC);

CALIBRATION; CAMERAS; CRYSTALS; IMAGING SYSTEMS; LASER BEAMS; OPTICAL RESOLVING POWER; SCANNING;

X RAY SPECTROSCOPY;

EID: 9944227853     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1788873     Document Type: Conference Paper

References (6)

1. B. L. Henke, H. T. Yamada, and T. J. Tanaka, Rev. Sci. Instrum. 54, 1311 (1983).
2. B. L. Henke and P. A. Jaanimagi, Rev. Sci. Instrum. 56, 1537 (1985).
3. B. A. Hammel, D. W. Phillion, and L. E. Ruggles, Rev. Sci. Instrum. 61, 1920 (1990).
4. J. E. Bailey et al., Phys. Plasmas 9, 2186 (2002).
5. M. J. May, R. F. Heeter, and J. E. Emig, Rev. Sci. Instrum., these proceedings.
6. B. L. Henke, E. M. Gullikson, and J. C. Davis, At. Data Nucl. Data Tables 54, 181 (1993).