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Volumn 75, Issue 10 II, 2004, Pages 4142-4144
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Measurement of impurity emission profiles in CHS Plasma using AXUV photodiode arrays and VUV bandpass filters
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Author keywords
[No Author keywords available]
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Indexed keywords
BANDPASS FILTERS;
BOLOMETERS;
DATA ACQUISITION;
DIGITAL SIGNAL PROCESSING;
ELECTRIC POWER SYSTEMS;
OXYGEN;
PHOTODIODES;
PHOTONS;
ABSOLUTE EXTREME ULTRAVIOLET (AXUV) PHOTODIODE;
COMPACT HELICAL SYSTEM (CHS);
NEUTRAL BEAM INJECTION (NBI);
VACUUM ULTRAVIOLET (VUV);
PLASMAS;
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EID: 9944222595
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1787132 Document Type: Conference Paper |
Times cited : (7)
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References (6)
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