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Volumn 273, Issue 1-2, 2004, Pages 19-25
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Strain relaxation in InGaAsP/InP grown by metal-organic vapor-phase epitaxy
a
HITACHI LTD
(Japan)
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Author keywords
A1. Critical strain; A1. Strain relaxation; B1. InGaAsP
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Indexed keywords
CRYSTAL GROWTH;
METALLORGANIC VAPOR PHASE EPITAXY;
MORPHOLOGY;
PHOTOLUMINESCENCE;
RELAXATION PROCESSES;
SEMICONDUCTOR QUANTUM WELLS;
STRAIN;
SURFACE PHENOMENA;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION;
CRITICAL STRAIN;
CRYSTAL SURFACES;
INGAASP;
STRAIN RELAXATION;
SEMICONDUCTING INDIUM COMPOUNDS;
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EID: 9944221909
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2004.07.094 Document Type: Article |
Times cited : (4)
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References (10)
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