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Volumn 75, Issue 10 II, 2004, Pages 4219-4221
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Integrating diagnostic data analysis for W7-AS using Bayesian graphical models
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Author keywords
[No Author keywords available]
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Indexed keywords
CARRIER CONCENTRATION;
COMPUTER SIMULATION;
DATA REDUCTION;
LIGHT SCATTERING;
MAGNETIC FLUX;
PROBABILITY DENSITY FUNCTION;
SYSTEMATIC ERRORS;
BAYESIAN GRAPHICAL MODELS;
ELECTRON TEMPERATURE;
THERMAL ENERGY;
PLASMA DIAGNOSTICS;
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EID: 9944221108
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1789611 Document Type: Conference Paper |
Times cited : (41)
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References (5)
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