Design of a heating-cooling stage for scanning tunneling microscopy and temperature programmed desorption experiments

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 22, Issue 5, 2004, Pages 2552-2554

  Illingworth, A ^a   Zhou, J ^a   Ozturk, O ^a   Chen, D A ^a  

^a UNIVERSITY OF SOUTH CAROLINA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BORON NITRIDE; ELECTRICAL CONNECTIONS; LOCK TRANSFER; OMNICRON'S VARIABLE TEMPERATURE;

CONTROL EQUIPMENT; ELECTRIC CURRENTS; ELECTRON BEAMS; HEATING; SCANNING TUNNELING MICROSCOPY; TANTALUM; TEMPERATURE PROGRAMMED DESORPTION; TUNGSTEN;

THERMOCOUPLES;

EID: 9744279035     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1781661     Document Type: Review

References (2)

1. K. D. John, J. Wan, and J. T. Yates, Jr., J. Vac. Sci. Technol. B 11, 2137 (1993).
2. J. Zhou, S. Ma, Y. C. Kang, and D. A. Chen, J. Phys. Chem. B (in press).