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Volumn 176, Issue 1-2, 2005, Pages 149-154

Low temperature dielectric behavior and ac conductivity in metal-containing chalcogenide Ge2S3 films

Author keywords

ac conductivity; Amorphous; Dielectric properties; Semiconductors

Indexed keywords

ANNEALING; DIELECTRIC MATERIALS; LOW TEMPERATURE EFFECTS; MATHEMATICAL MODELS; METAL ANALYSIS; PERMITTIVITY; SEMICONDUCTOR MATERIALS; SINGLE CRYSTALS;

EID: 9744256245     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssi.2004.07.004     Document Type: Article
Times cited : (6)

References (22)
  • 5
    • 9744221408 scopus 로고    scopus 로고
    • Cai. Liuchun, P. Boolchand, American Physical Society MAR2002, Abstract #X25.008
    • Cai. Liuchun, P. Boolchand, American Physical Society MAR2002, Abstract #X25.008.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.