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Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 22, Issue 5, 2004, Pages 2423-2428

Effects of Cu at the device junction on the properties of CdTe/CdS photovoltaic cells

(6) Berniard, T J a Albin, D S a To, B a Pankow, J W a Young, M a Asher, S E a

a NATIONAL RENEWABLE ENERGY LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM SULFIDE (CDS); DEVICE JUNCTIONS; SPECTROPHOTOMETRIC ANALYSIS; STRESSED STATE;

AUGER ELECTRON SPECTROSCOPY; CADMIUM COMPOUNDS; DEGRADATION; PHOTOVOLTAIC CELLS; QUANTUM EFFICIENCY; SECONDARY ION MASS SPECTROMETRY; SPECTROPHOTOMETERS; X RAY DIFFRACTION ANALYSIS;

COPPER;

EID: 9744246029 PISSN: 10711023 EISSN: None Source Type: Journal
DOI: 10.1116/1.1800311 Document Type: Article

Times cited : (25)

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