High-reliability topological architectures for networks under stress

IEEE Journal on Selected Areas in Communications

Volumn 22, Issue 9, 2004, Pages 1830-1845

  Weichenberg, Guy ^a   Chan, Vincent W S ^a   Médard, Muriel ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Link failures; Network design; Network reliability; Physical network topology

Indexed keywords

APPROXIMATION THEORY; OPTIMIZATION; SIGNAL PROCESSING; STRESS ANALYSIS; TELECOMMUNICATION NETWORKS; TOPOLOGY; WIDE AREA NETWORKS;

LINK FAILURES; NETWORK DESIGN; NETWORK RELIABILITY; PHYSICAL NETWORK TOPOLOGY;

OPTICAL COMMUNICATION;

EID: 9744245324     PISSN: 07338716     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSAC.2004.835750     Document Type: Article

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