Regular and random magnetic resonance force microscopy signal with a cantilever oscillating parallel to a sample surface

Journal of Applied Physics

Volumn 96, Issue 9, 2004, Pages 5081-5084

  Berman, G P ^a   Gorshkov, V N ^a   Tsifrinovich, V I ^b  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b POLYTECHNIC UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADIABATIC REVERSALS; FERROMAGNETIC PARTICLES; MAGNETIC RESONANCE FORCE MICROSCOPY (MRFM); RANDOM SIGNALS;

FERROMAGNETIC MATERIALS; FREQUENCIES; MAGNETIC FIELD EFFECTS; MAGNETIC RESONANCE; OSCILLATIONS; SPECTRUM ANALYSIS; SURFACE PROPERTIES;

MICROSCOPIC EXAMINATION;

EID: 9744239509     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1787141     Document Type: Article

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