The dynamic characteristics of sulfur sensitization centers in T-grain AgBrI microcrystals

Journal of Applied Physics

Volumn 96, Issue 9, 2004, Pages 5373-5375

  Fu, Guang Sheng ^a   Yang, Shao Peng ^a   Li, Xiao Wei ^a   Liu, Rong Juan ^a   Tian, Xiao Dong ^a   Han, Li ^a  

^a HEBEI UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS; DIELECTRIC DEVICES; ELECTRON TRAPS; MODULATION; PHOTOCONDUCTIVITY; SENSORS; SILVER COMPOUNDS;

EMULSION GRAIN; FIRST-ORDER DECAY AREAS; MICROWAVE CAVITY; SULFUR SENSITIZATION;

SULFUR;

EID: 9744235098     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1801154     Document Type: Article

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