Effects of CuO on the grain size and electrical properties of SnO 2-based varistors

Materials Science and Engineering: B

Volumn 116, Issue 1, 2005, Pages 54-58

  Wang, Chun Ming ^a   Wang, Jin Feng ^a   Chen, Hong Cun ^a   Su, Wen Bin ^a   Zang, Guo Zhong ^a   Qi, Peng ^a   Zhao, Ming Lei ^a  

^a SHANDONG UNIVERSITY   (China)

Author keywords

CuO; Defect barriers; Dielectric properties; Electrical properties; Tin oxide; Varistors

Indexed keywords

CERAMIC MATERIALS; DIELECTRIC MATERIALS; GRAIN SIZE AND SHAPE; MICROSTRUCTURE; PERMITTIVITY; TIN COMPOUNDS; VARISTORS;

DEFECT BARRIERS; NONLINEAR ELECTRICAL PROPERTY; TIN OXIDE;

COPPER OXIDES;

EID: 9644257322     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2004.09.009     Document Type: Article

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