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Volumn 216, Issue 1-4, 2001, Pages 65-66

Crystal structure of 4-benzoylpyridinium-1-squarate, C16H9NO4

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EID: 9444296276     PISSN: 14337266     EISSN: None     Source Type: Journal    
DOI: 10.1524/ncrs.2001.216.14.65     Document Type: Article
Times cited : (11)

References (8)
  • 1
    • 0037964874 scopus 로고
    • Ein neues, einfaches Verfahren zur Darstellung von Ammonium- und Phosphonium- Betainen der Quad-ratsaure.
    • Schmidt, A. H.; Becker, U.; Aiméne, A.: Ein neues, einfaches Verfahren zur Darstellung von Ammonium- und Phosphonium- Betainen der Quad-ratsaure. Tetrahedron Lett. 25 (1984) 4475-4478.
    • (1984) Tetrahedron Lett. , vol.25 , pp. 4475-4478
    • Schmidt, A.H.1    Becker, U.2    Aiméne, A.3
  • 3
    • 0003519459 scopus 로고    scopus 로고
    • Organic Materials for Second-Order Non-Linear Optics.
    • (Ed. D. Bethell)
    • Wolff, J. J.; Wortmann, R.: Organic Materials for Second-Order Non-Linear Optics. In: Advances in Physical Organic Chemistry (Ed. D. Bethell), Vol. 32, p. 121-217, 1999.
    • (1999) Advances in Physical Organic Chemistry , vol.32 , pp. 121-217
    • Wolff, J.J.1    Wortmann, R.2
  • 5
    • 0001117612 scopus 로고
    • A system of Fortran routines for calculating molecular structure parameters from the results of crystal structure analyses.
    • Nardelli, M.: A system of Fortran routines for calculating molecular structure parameters from the results of crystal structure analyses. J. Appl. Crystallogr. 28(1995)659.
    • (1995) J. Appl. Crystallogr. , vol.28 , pp. 659
    • Nardelli, M.1
  • 6
    • 84943920736 scopus 로고
    • Phase Annealing in SHELX-90: Direct Methods for Larger Structures.
    • Sheldrick, G. M.: Phase Annealing in SHELX-90: Direct Methods for Larger Structures. Acta Crystallogr. A46 (1990) 467-473.
    • (1990) Acta Crystallogr. , vol.A46 , pp. 467-473
    • Sheldrick, G.M.1
  • 7
    • 85025259396 scopus 로고
    • SHELXTL-Plus. Release 4.1 Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
    • Sheldrick, G. M.: SHELXTL-Plus. Release 4.1 Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA 1991.
    • (1991)
    • Sheldrick, G.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.