The HVEE tandetron AMS system at Nagoya University

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 172, Issue 1-4, 2000, Pages 52-57

  Nakamura, T ^a   Niu, E ^a   Oda, H ^a   Ikeda, A ^a   Minami, M ^a   Takahashi, H ^a   Adachi, M ^a   Pals, L ^b   Gottdang, A ^b   Suya, N ^c  

^a NAGOYA UNIVERSITY   (Japan)

^b High Voltage Eng Europe B V   (Netherlands)

^c Marubun Corporation   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; EQUIPMENT TESTING; GRAPHITE; PARTICLE ACCELERATORS; RADIOACTIVITY MEASUREMENT; RADIOISOTOPES; SOCIETIES AND INSTITUTIONS; STABILITY;

ACCELERATOR MASS SPECTROMETRY; REPRODUCIBILITY TEST;

MASS SPECTROMETRY;

EID: 9444255108     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(00)00398-0     Document Type: Article

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