|
Volumn 30, Issue 2-4 SPEC. ISS., 2005, Pages 485-495
|
Measurements of surface temperature and emissivity by two-dimensional four-color thermometry with narrow bandwidth
|
Author keywords
[No Author keywords available]
|
Indexed keywords
CHARGE COUPLED DEVICES;
DEFECTS;
OPTICAL FILTERS;
PROCESS CONTROL;
PYROLYSIS;
TEMPERATURE DISTRIBUTION;
HEATED MATERIAL SURFACE;
PROCESS MONITORING;
SURFACE TEMPERATURE;
SURFACE TREATMENT;
THERMOMETRY;
|
EID: 9444245924
PISSN: 03605442
EISSN: None
Source Type: Journal
DOI: 10.1016/j.energy.2004.09.007 Document Type: Conference Paper |
Times cited : (10)
|
References (4)
|