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Volumn 30, Issue 2-4 SPEC. ISS., 2005, Pages 485-495

Measurements of surface temperature and emissivity by two-dimensional four-color thermometry with narrow bandwidth

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; DEFECTS; OPTICAL FILTERS; PROCESS CONTROL; PYROLYSIS; TEMPERATURE DISTRIBUTION;

EID: 9444245924     PISSN: 03605442     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.energy.2004.09.007     Document Type: Conference Paper
Times cited : (10)

References (4)
  • 2
    • 0027639149 scopus 로고
    • Refractive indices of water and ice in the 0.65 micron range
    • Kou L, Labrie D, Chylek P. Refractive indices of water and ice in the 0.65 micron range. Applied Optics 1993;32:3531-40.
    • (1993) Applied Optics , vol.32 , pp. 3531-3540
    • Kou, L.1    Labrie, D.2    Chylek, P.3
  • 3
    • 85017992536 scopus 로고    scopus 로고
    • Spectroscopic measurements of improved radiative heat transfer from high emissivity materials by two-dimensional two-color thermometry with narrow-bandpass width
    • in press
    • Tago Y, Akimoto F, Kitagawa K, Arai N, Churchill SW, Gupta AK. Spectroscopic measurements of improved radiative heat transfer from high emissivity materials by two-dimensional two-color thermometry with narrow-bandpass width. Journal of Engineering for Gas Turbines and Power, in press.
    • Journal of Engineering for Gas Turbines and Power
    • Tago, Y.1    Akimoto, F.2    Kitagawa, K.3    Arai, N.4    Churchill, S.W.5    Gupta, A.K.6
  • 4
    • 85018009241 scopus 로고    scopus 로고
    • The Society of Chemical Engineers, Japan, Kagaku Kougaku Binran, Maruzen Co., Ltd.; 1988. p. 363
    • The Society of Chemical Engineers, Japan, Kagaku Kougaku Binran, Maruzen Co., Ltd.; 1988. p. 363.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.