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Volumn 67, Issue 9, 1996, Pages 3369-
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The Advanced Photon Source Metrology Laboratory
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Author keywords
ADVANCED PHOTON SOURCE; ANL; MEASURING INSTRUMENTS; MIRRORS; OPTICAL SYSTEMS; SURFACE FINISHING; TOPOGRAPHY; X RAY EQUIPMENT
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Indexed keywords
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EID: 9444233235
PISSN: 00346748
EISSN: 10897623
Source Type: Journal
DOI: 10.1063/1.1147326 Document Type: Conference Paper |
Times cited : (2)
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References (0)
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