Analysis of spectroscopic scanning tunneling microscope images

Applied Physics A: Materials Science and Processing

Volumn 66, Issue SUPPL. 1, 1998, Pages

  Li, Jiutao ^a   Schneider, W D ^a   Berndt, R ^b  

^a UNIVERSITY OF LAUSANNE   (Switzerland)

^b RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AG(111) SURFACE; DIFFERENTIAL CONDUCTANCES; LOCAL DENSITY OF STATE; SCANNING TUNNELING MICROSCOPES; TUNNELING BARRIER;

ELECTRON ENERGY LOSS SPECTROSCOPY; SILVER; WIND TUNNELS;

SPECTROSCOPIC ANALYSIS;

EID: 9344237002     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s003390051123     Document Type: Article

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