Structural heterogeneity of the soil tilled layer as characterized by 2D electrical resistivity surveying

Soil and Tillage Research

Volumn 79, Issue 2 SPEC.ISS., 2004, Pages 239-249

  Besson, A ^a   Cousin, I ^a   Samouelian A ^a   Boizard, H ^a   Richard, G ^a  

^a CEMAGREF   (France)

Author keywords

Bulk density; Electrical resistivity; Structure; Tilled layers; Visual morphological description

Indexed keywords

CULTIVATION; ELECTRIC RESISTANCE; GEOPHYSICS; MORPHOLOGY; SENSORS; THREE DIMENSIONAL;

2D WENNER CONFIGURATION; CAMPBELL EQUATIONS; INTER-ELECTRODE SPACING; STRUCTURAL HETEROGENEITY;

SOILS;

BULK DENSITY; ELECTRICAL RESISTIVITY; SOIL STRUCTURE; SURVEYING; TILLAGE;

ANATOMY; CULTIVATION; ELECTRIC RESISTANCE; SENSORS; SOIL; THREE DIMENSIONAL DESIGN;

EID: 9344221624     PISSN: 01671987     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.still.2004.07.012     Document Type: Conference Paper

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