Development of high quantum efficiency, flat panel, thick detectors for megavoltage x-ray imaging: A novel direct-conversion design and its feasibility

Medical Physics

Volumn 31, Issue 11, 2004, Pages 3004-3016

  Pang, G ^a   Rowlands, J A ^b  

^a DEPARTMENT OF RADIATION ONCOLOGY   (Canada)

^b SUNNYBROOK RESEARCH INSTITUTE   (Canada)

Author keywords

EPIDs; Flat panel detectors; Megavoltage cone beam CT; Portal imaging; Quantum efficiency

Indexed keywords

EFFICIENCY; IMAGE RESOLUTION; IONIZATION OF GASES; QUANTUM EFFICIENCY; QUANTUM NOISE; X RAY ABSORPTION; X RAY DETECTORS;

ELECTRONIC PORTAL IMAGING DEVICES; EPIDS; FLAT PANEL DETECTORS; HIGH QUANTUM EFFICIENCY; HIGH-DENSITY MATERIALS; MEGAVOLTAGE CONE-BEAM CT; PHOTOLITHOGRAPHIC PATTERNING; PORTAL IMAGING;

COMPUTERIZED TOMOGRAPHY;

ARTICLE; CALCULATION; FEASIBILITY STUDY; IMAGE PROCESSING; IONIZATION; LOW ENERGY RADIATION; MEGAVOLTAGE RADIATION; OPTICAL RESOLUTION; PRIORITY JOURNAL; PRODUCTIVITY; RADIATION ABSORPTION; RADIATION DETECTOR; SENSITIVITY ANALYSIS; THICKNESS; X RAY; X RAY FILM; XERORADIOGRAPHY;

EID: 9244253183     PISSN: 00942405     EISSN: None     Source Type: Journal    
DOI: 10.1118/1.1803771     Document Type: Article

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