Recognition by symmetry derivatives and the generalized structure tensor

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 26, Issue 12, 2004, Pages 1590-1605

  Bigun, Josef ^a   Bigun, Tomas ^b   Nilsson, Kenneth ^a  

^a HALMSTAD UNIVERSITY   (Sweden)

^b TietoEnator AB   (Sweden)

Author keywords

Alignment; Cross detection; Differential invariants; Feature measurement; Filtering; Fingerprints; Gaussians; Invariants; Moments; Orientation fields; Registration; Representations shape; Structure tensor; Tensor voting; Tracking; Vision and scene understanding; Wavelets and fractals

Indexed keywords

COMPUTER VISION; FEATURE EXTRACTION; FRACTALS; IMAGE ANALYSIS; MATHEMATICAL OPERATORS; PATTERN MATCHING; TENSORS; THEOREM PROVING; VECTORS; WAVELET TRANSFORMS;

CROSS DETECTION; DIFFERENTIAL INVARIANTS; FEATURE MEASUREMENT; FINGERPRINTS; GENERALIZED STRUCTURE TENSOR; SYMMETRY DERIVATIVES; TENSOR VOTING;

PATTERN RECOGNITION;

ARTICLE; AUTOMATED PATTERN RECOGNITION; DERMATOGLYPHICS; HUMAN;

DERMATOGLYPHICS; HUMANS; PATTERN RECOGNITION, AUTOMATED;

EID: 9244242591     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPAMI.2004.126     Document Type: Article

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