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Volumn 28, Issue 2, 2004, Pages 235-242

Deposition of optical coatings with real time control by the spectroellipsometry

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CONTROL SYSTEMS; ELLIPSOMETRY; FILM GROWTH; PARAMETER ESTIMATION; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; REAL TIME SYSTEMS; REFRACTIVE INDEX; THIN FILMS;

EID: 9244229585     PISSN: 12860042     EISSN: None     Source Type: Journal    
DOI: 10.1051/epjap:2004191     Document Type: Article
Times cited : (6)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.