The non-destructive and nano-microstructural characterization of thermal-barrier coatings

JOM

Volumn 56, Issue 10, 2004, Pages 53-56

  Sohn, Y H ^a   Jayaraj, B ^a   Laxman, S ^a   Franke, B ^a   Byeon, J W ^a   Karlsson, A M ^b  

^a UNIVERSITY OF CENTRAL FLORIDA   (United States)

^b UNIVERSITY OF DELAWARE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DURABILITY; ELECTROCHEMISTRY; EMISSION SPECTROSCOPY; LUMINESCENCE; MAINTAINABILITY; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; NONDESTRUCTIVE EXAMINATION; QUALITY CONTROL; RELIABILITY; RESIDUAL STRESSES; TURBINES;

HOT SECTION COMPONENTS; PHASE CONSTITUENTS; PHOTOSTIMULATED LUMINESCENCE SPECTROSCOPY (PSLS); SERVICE RELIABILITY;

THERMAL BARRIER COATINGS;

EID: 9244227976     PISSN: 10474838     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11837-004-0292-2     Document Type: Article

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