Stress-induced stacking faults in the Cu/Au interface

Journal of Physics Condensed Matter

Volumn 16, Issue 43, 2004, Pages 7823-7828

  Lei, H ^a   Tang, Y J ^a  

^a RESEARCH CENTER OF LASER FUSION   (China)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CRYSTAL LATTICES; INTERFACES (MATERIALS); MOLECULAR DYNAMICS; NANOSTRUCTURED MATERIALS; STRESS ANALYSIS;

ATOMIC DEPOSITION; IONIZED CLUSTER BEAM DEPOSITION (ICBD); LATTICE MISFIT; LATTICE ROTATIONS;

STACKING FAULTS;

EID: 9144267416     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/16/43/021     Document Type: Article

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