|
Volumn 17, Issue 4, 2004, Pages 497-503
|
Process optimization and PFC emission reduction using a c-C 4F8 chamber cleaning process on a novellus concept 1 dielectric PECVD tool
|
Author keywords
C4F8; Chamber cleaning; COO; Emissions; Perfluorocompound (PFC); Plasma enhanced chemical vapor deposition (PECVD)
|
Indexed keywords
CHEMICAL CLEANING;
CHEMICAL VAPOR DEPOSITION;
DATA REDUCTION;
FLOW OF FLUIDS;
GASES;
OPTIMIZATION;
PARTICULATE EMISSIONS;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
CHAMBER CLEANING;
GAS CONSUMPTION;
PERFLUOROCOMPOUND (PFC) EMISSIONS;
WAFER FABRICATION;
FLUORINE COMPOUNDS;
|
EID: 9144267146
PISSN: 08946507
EISSN: None
Source Type: Journal
DOI: 10.1109/TSM.2004.835712 Document Type: Article |
Times cited : (2)
|
References (7)
|