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Volumn 15, Issue 2, 1997, Pages 241-246

Electrical and structural characterization of PtSi/p-Si1-XGeX low Schottky barrier junctions prepared by co-sputtering

Author keywords

[No Author keywords available]

Indexed keywords


EID: 9144265040     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (17)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.