Infrared ellipsometry of self-assembled octadecylmercaptan on gold films and nanoislands: Effects of thickness and morphology of the gold layer

Journal of Physical Chemistry B

Volumn 108, Issue 45, 2004, Pages 17523-17530

  Bradford, D C ^a,b   Hutter, E ^a,b   Assiongbon, K A ^a,c   Fendler, J H ^a,b   Roy, D ^a,b,c  

^a CLARKSON UNIVERSITY   (United States)

^b Ctr for Adv Materials Processing   (United States)

^c Box 5820 ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DETECTION SENSITIVITY; GOLD FILMS; GOLD LAYER; INFRARED SPECTROSCOPIC ELLIPSOMETRY (IRSE);

ABSORPTION SPECTROSCOPY; ELLIPSOMETRY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MORPHOLOGY; NANOSTRUCTURED MATERIALS; PARAMETER ESTIMATION; SCANNING ELECTRON MICROSCOPY; SELF ASSEMBLY; SUBSTRATES; THICK FILMS;

GOLD;

EID: 9144262471     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp0471305     Document Type: Article

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