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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 43, Issue 9 A, 2004, Pages 6248-6251

Study of Mg ion intercalation in polycrystalline MoO3 thin films

(3) Sian, Tarsame S a Reddy, Gade B a Shivaprasad, Sonnada M b

a INDIAN INSTITUTE OF TECHNOLOGY DELHI (India)

b NATIONAL PHYSICAL LABORATORY (India)

Author keywords

And cyclic voltammetry; Core levels; Diffusion coefficient; Intercalation

Indexed keywords

ANNEALING; CRYSTAL LATTICES; CYCLIC VOLTAMMETRY; DIFFUSION; DOPING (ADDITIVES); MOLYBDENUM COMPOUNDS; POLYCRYSTALLINE MATERIALS; STRUCTURAL ANALYSIS; X RAY DIFFRACTION;

CHARGE DUMPING; CORE LEVELS; PHOTROELECTRIC EMISSION;

THIN FILMS;

EID: 9144239567 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/JJAP.43.6248 Document Type: Article

Times cited : (19)

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