SCOPUS 정보 검색 플랫폼

Volumn 29, Issue 21, 2004, Pages 2467-2469

Frequency metrology with a turnkey all-fiber system

Author keywords

[No Author keywords available]

Indexed keywords

ALL-FIBER SYSTEMS; FREQUENCY METROLOGY; PHOTONIC CRYSTALS (PC);

CESIUM; CRYSTALS; HYDROGEN; LASER OPTICS; MASERS; OPTICAL FIBERS; OPTICAL VARIABLES MEASUREMENT; PHOTONS;

FREQUENCIES;

EID: 9144238804 PISSN: 01469592 EISSN: None Source Type: Journal
DOI: 10.1364/OL.29.002467 Document Type: Article

Times cited : (222)

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