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Volumn 118, Issue 25, 1996, Pages 6086-6086

Interfacial hydrogen bonding. Self-assembly of a monolayer of a fullerene - crown ether derivative on gold surfaces derivatized with an ammonium-terminated alkanethiolate

Author keywords

[No Author keywords available]

Indexed keywords

CROWN ETHER DERIVATIVE; FULLERENE DERIVATIVE;

EID: 8944224011     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja960445g     Document Type: Article
Times cited : (141)

References (26)
  • 3
    • 0001286077 scopus 로고
    • Some representative (not at all exhaustive) publications are as follows: (a) Maliszewskyj, N. C.; Heiney, P. A.; Jones, D. R.; Strongin, R. M.; Cichy, M. A.; Smith, A. B., III Langmuir 1993, 9, 1439. (b) Xiao, Y.; Yao, Z.; Jin, D. J. Phys. Chem. 1994, 98, 5557. (c) Brousseau, J.-L.; Tian, K.; Gauvin, S.; Leblanc, R. M.; Delhaès, P. Chem. Phys. Lett. 1993, 202, 521. (d) Ravaine, S.; Le Pecq, F.; Mingotaud, C.; Delhaès, P.; Hummelen, J. C.; Wudl, F.; Patterson, L. K. J. Phys. Chem. 1995, 99, 9551. (e) Back, R.; Lennox, R. B.; J. Phys. Chem. 1992, 96, 8149.
    • (1993) Langmuir , vol.9 , pp. 1439
    • Maliszewskyj, N.C.1    Heiney, P.A.2    Jones, D.R.3    Strongin, R.M.4    Cichy, M.A.5    Smith III, A.B.6
  • 4
    • 0028442299 scopus 로고
    • Some representative (not at all exhaustive) publications are as follows: (a) Maliszewskyj, N. C.; Heiney, P. A.; Jones, D. R.; Strongin, R. M.; Cichy, M. A.; Smith, A. B., III Langmuir 1993, 9, 1439. (b) Xiao, Y.; Yao, Z.; Jin, D. J. Phys. Chem. 1994, 98, 5557. (c) Brousseau, J.-L.; Tian, K.; Gauvin, S.; Leblanc, R. M.; Delhaès, P. Chem. Phys. Lett. 1993, 202, 521. (d) Ravaine, S.; Le Pecq, F.; Mingotaud, C.; Delhaès, P.; Hummelen, J. C.; Wudl, F.; Patterson, L. K. J. Phys. Chem. 1995, 99, 9551. (e) Back, R.; Lennox, R. B.; J. Phys. Chem. 1992, 96, 8149.
    • (1994) J. Phys. Chem. , vol.98 , pp. 5557
    • Xiao, Y.1    Yao, Z.2    Jin, D.3
  • 5
    • 0001608690 scopus 로고
    • Some representative (not at all exhaustive) publications are as follows: (a) Maliszewskyj, N. C.; Heiney, P. A.; Jones, D. R.; Strongin, R. M.; Cichy, M. A.; Smith, A. B., III Langmuir 1993, 9, 1439. (b) Xiao, Y.; Yao, Z.; Jin, D. J. Phys. Chem. 1994, 98, 5557. (c) Brousseau, J.-L.; Tian, K.; Gauvin, S.; Leblanc, R. M.; Delhaès, P. Chem. Phys. Lett. 1993, 202, 521. (d) Ravaine, S.; Le Pecq, F.; Mingotaud, C.; Delhaès, P.; Hummelen, J. C.; Wudl, F.; Patterson, L. K. J. Phys. Chem. 1995, 99, 9551. (e) Back, R.; Lennox, R. B.; J. Phys. Chem. 1992, 96, 8149.
    • (1993) Chem. Phys. Lett. , vol.202 , pp. 521
    • Brousseau, J.-L.1    Tian, K.2    Gauvin, S.3    Leblanc, R.M.4    Delhaès, P.5
  • 6
    • 0029639456 scopus 로고
    • Some representative (not at all exhaustive) publications are as follows: (a) Maliszewskyj, N. C.; Heiney, P. A.; Jones, D. R.; Strongin, R. M.; Cichy, M. A.; Smith, A. B., III Langmuir 1993, 9, 1439. (b) Xiao, Y.; Yao, Z.; Jin, D. J. Phys. Chem. 1994, 98, 5557. (c) Brousseau, J.-L.; Tian, K.; Gauvin, S.; Leblanc, R. M.; Delhaès, P. Chem. Phys. Lett. 1993, 202, 521. (d) Ravaine, S.; Le Pecq, F.; Mingotaud, C.; Delhaès, P.; Hummelen, J. C.; Wudl, F.; Patterson, L. K. J. Phys. Chem. 1995, 99, 9551. (e) Back, R.; Lennox, R. B.; J. Phys. Chem. 1992, 96, 8149.
    • (1995) J. Phys. Chem. , vol.99 , pp. 9551
    • Ravaine, S.1    Le Pecq, F.2    Mingotaud, C.3    Delhaès, P.4    Hummelen, J.C.5    Wudl, F.6    Patterson, L.K.7
  • 7
    • 0000351137 scopus 로고
    • Some representative (not at all exhaustive) publications are as follows: (a) Maliszewskyj, N. C.; Heiney, P. A.; Jones, D. R.; Strongin, R. M.; Cichy, M. A.; Smith, A. B., III Langmuir 1993, 9, 1439. (b) Xiao, Y.; Yao, Z.; Jin, D. J. Phys. Chem. 1994, 98, 5557. (c) Brousseau, J.-L.; Tian, K.; Gauvin, S.; Leblanc, R. M.; Delhaès, P. Chem. Phys. Lett. 1993, 202, 521. (d) Ravaine, S.; Le Pecq, F.; Mingotaud, C.; Delhaès, P.; Hummelen, J. C.; Wudl, F.; Patterson, L. K. J. Phys. Chem. 1995, 99, 9551. (e) Back, R.; Lennox, R. B.; J. Phys. Chem. 1992, 96, 8149.
    • (1992) J. Phys. Chem. , vol.96 , pp. 8149
    • Back, R.1    Lennox, R.B.2
  • 8
    • 84989573837 scopus 로고
    • For a comprehensive reference, see: Jonas, U.; Cardullo, F.; Belik, P.; Diederich, F.; Gügel, A.; Harth, E.; Hermann, A.; Isaacs, L.; Müllen, K.; Ringsdorf, H.; Thilgen, C.; Uhlmann, P.; Vasella, A.; Waldraff, C. A. A.; Walter, M. Chem. Eur. J. 1995, 1, 243 and references therein. Other pertinent references are as follows: (a) Leigh, D. A.; Moody, A. E.; Wade, F. A.; King, T. A.; West, D.; Bahra, G. S Langmuir 1995, 11, 2334. (b) Diederich, F.; Jonas, U.; Gramlich, V.; Herrmann, A.; Ringsdorf, H.; Thilgen, C. Helv. Chim. Acta 1993, 76, 2445. (c) Gan, L. B.; Zhou, D. J.; Luo, C. P.; Huang, C. H.; Li, T. K.; Bai, J.; Zhao, X. S.; Xia, X. H. J. Phys. Chem. 1994, 98, 12459. (d) Zhou, D.; Gan, L.; Luo, C.; Tan, H.; Huang, C.; Liu, Z.; Wu, Z.; Zhao, X.; Xia, X.; Zhang, S.; Sun, F.; Xia, Z.; Zou, Y. Chem. Phys. Lett. 1995, 235, 548.
    • (1995) Chem. Eur. J. , vol.1 , pp. 243
    • Jonas, U.1    Cardullo, F.2    Belik, P.3    Diederich, F.4    Gügel, A.5    Harth, E.6    Hermann, A.7    Isaacs, L.8    Müllen, K.9    Ringsdorf, H.10    Thilgen, C.11    Uhlmann, P.12    Vasella, A.13    Waldraff, C.A.A.14    Walter, M.15
  • 9
    • 0000844805 scopus 로고
    • For a comprehensive reference, see: Jonas, U.; Cardullo, F.; Belik, P.; Diederich, F.; Gügel, A.; Harth, E.; Hermann, A.; Isaacs, L.; Müllen, K.; Ringsdorf, H.; Thilgen, C.; Uhlmann, P.; Vasella, A.; Waldraff, C. A. A.; Walter, M. Chem. Eur. J. 1995, 1, 243 and references therein. Other pertinent references are as follows: (a) Leigh, D. A.; Moody, A. E.; Wade, F. A.; King, T. A.; West, D.; Bahra, G. S Langmuir 1995, 11, 2334. (b) Diederich, F.; Jonas, U.; Gramlich, V.; Herrmann, A.; Ringsdorf, H.; Thilgen, C. Helv. Chim. Acta 1993, 76, 2445. (c) Gan, L. B.; Zhou, D. J.; Luo, C. P.; Huang, C. H.; Li, T. K.; Bai, J.; Zhao, X. S.; Xia, X. H. J. Phys. Chem. 1994, 98, 12459. (d) Zhou, D.; Gan, L.; Luo, C.; Tan, H.; Huang, C.; Liu, Z.; Wu, Z.; Zhao, X.; Xia, X.; Zhang, S.; Sun, F.; Xia, Z.; Zou, Y. Chem. Phys. Lett. 1995, 235, 548.
    • (1995) Langmuir , vol.11 , pp. 2334
    • Leigh, D.A.1    Moody, A.E.2    Wade, F.A.3    King, T.A.4    West, D.5    Bahra, G.S.6
  • 10
    • 84987485453 scopus 로고
    • For a comprehensive reference, see: Jonas, U.; Cardullo, F.; Belik, P.; Diederich, F.; Gügel, A.; Harth, E.; Hermann, A.; Isaacs, L.; Müllen, K.; Ringsdorf, H.; Thilgen, C.; Uhlmann, P.; Vasella, A.; Waldraff, C. A. A.; Walter, M. Chem. Eur. J. 1995, 1, 243 and references therein. Other pertinent references are as follows: (a) Leigh, D. A.; Moody, A. E.; Wade, F. A.; King, T. A.; West, D.; Bahra, G. S Langmuir 1995, 11, 2334. (b) Diederich, F.; Jonas, U.; Gramlich, V.; Herrmann, A.; Ringsdorf, H.; Thilgen, C. Helv. Chim. Acta 1993, 76, 2445. (c) Gan, L. B.; Zhou, D. J.; Luo, C. P.; Huang, C. H.; Li, T. K.; Bai, J.; Zhao, X. S.; Xia, X. H. J. Phys. Chem. 1994, 98, 12459. (d) Zhou, D.; Gan, L.; Luo, C.; Tan, H.; Huang, C.; Liu, Z.; Wu, Z.; Zhao, X.; Xia, X.; Zhang, S.; Sun, F.; Xia, Z.; Zou, Y. Chem. Phys. Lett. 1995, 235, 548.
    • (1993) Helv. Chim. Acta , vol.76 , pp. 2445
    • Diederich, F.1    Jonas, U.2    Gramlich, V.3    Herrmann, A.4    Ringsdorf, H.5    Thilgen, C.6
  • 11
    • 0001639480 scopus 로고
    • For a comprehensive reference, see: Jonas, U.; Cardullo, F.; Belik, P.; Diederich, F.; Gügel, A.; Harth, E.; Hermann, A.; Isaacs, L.; Müllen, K.; Ringsdorf, H.; Thilgen, C.; Uhlmann, P.; Vasella, A.; Waldraff, C. A. A.; Walter, M. Chem. Eur. J. 1995, 1, 243 and references therein. Other pertinent references are as follows: (a) Leigh, D. A.; Moody, A. E.; Wade, F. A.; King, T. A.; West, D.; Bahra, G. S Langmuir 1995, 11, 2334. (b) Diederich, F.; Jonas, U.; Gramlich, V.; Herrmann, A.; Ringsdorf, H.; Thilgen, C. Helv. Chim. Acta 1993, 76, 2445. (c) Gan, L. B.; Zhou, D. J.; Luo, C. P.; Huang, C. H.; Li, T. K.; Bai, J.; Zhao, X. S.; Xia, X. H. J. Phys. Chem. 1994, 98, 12459. (d) Zhou, D.; Gan, L.; Luo, C.; Tan, H.; Huang, C.; Liu, Z.; Wu, Z.; Zhao, X.; Xia, X.; Zhang, S.; Sun, F.; Xia, Z.; Zou, Y. Chem. Phys. Lett. 1995, 235, 548.
    • (1994) J. Phys. Chem. , vol.98 , pp. 12459
    • Gan, L.B.1    Zhou, D.J.2    Luo, C.P.3    Huang, C.H.4    Li, T.K.5    Bai, J.6    Zhao, X.S.7    Xia, X.H.8
  • 12
    • 0000421850 scopus 로고
    • For a comprehensive reference, see: Jonas, U.; Cardullo, F.; Belik, P.; Diederich, F.; Gügel, A.; Harth, E.; Hermann, A.; Isaacs, L.; Müllen, K.; Ringsdorf, H.; Thilgen, C.; Uhlmann, P.; Vasella, A.; Waldraff, C. A. A.; Walter, M. Chem. Eur. J. 1995, 1, 243 and references therein. Other pertinent references are as follows: (a) Leigh, D. A.; Moody, A. E.; Wade, F. A.; King, T. A.; West, D.; Bahra, G. S Langmuir 1995, 11, 2334. (b) Diederich, F.; Jonas, U.; Gramlich, V.; Herrmann, A.; Ringsdorf, H.; Thilgen, C. Helv. Chim. Acta 1993, 76, 2445. (c) Gan, L. B.; Zhou, D. J.; Luo, C. P.; Huang, C. H.; Li, T. K.; Bai, J.; Zhao, X. S.; Xia, X. H. J. Phys. Chem. 1994, 98, 12459. (d) Zhou, D.; Gan, L.; Luo, C.; Tan, H.; Huang, C.; Liu, Z.; Wu, Z.; Zhao, X.; Xia, X.; Zhang, S.; Sun, F.; Xia, Z.; Zou, Y. Chem. Phys. Lett. 1995, 235, 548.
    • (1995) Chem. Phys. Lett. , vol.235 , pp. 548
    • Zhou, D.1    Gan, L.2    Luo, C.3    Tan, H.4    Huang, C.5    Liu, Z.6    Wu, Z.7    Zhao, X.8    Xia, X.9    Zhang, S.10    Sun, F.11    Xia, Z.12    Zou, Y.13
  • 24
    • 0026204382 scopus 로고
    • 3+ as reported elsewhere (See: Gomez, M.; Li, J.; Kaifer, A. E. Langmuir 1991, 7, 1797). The roughness factors of the gold-bead electrodes were typically in the range 1.1-1.2 as measured from the charge passed during the oxidation of a monolayer of chemisorbed iodine (Rodríguez, J. F.; Mebrahtu, T.; Soriaga, M. P. J. Electroanal. Chem. 1987, 233. 283J. The surface coverage values reported here were corrected for surface roughness.
    • (1991) Langmuir , vol.7 , pp. 1797
    • Gomez, M.1    Li, J.2    Kaifer, A.E.3
  • 25
    • 0000513012 scopus 로고
    • 3+ as reported elsewhere (See: Gomez, M.; Li, J.; Kaifer, A. E. Langmuir 1991, 7, 1797). The roughness factors of the gold-bead electrodes were typically in the range 1.1-1.2 as measured from the charge passed during the oxidation of a monolayer of chemisorbed iodine (Rodríguez, J. F.; Mebrahtu, T.; Soriaga, M. P. J. Electroanal. Chem. 1987, 233. 283J. The surface coverage values reported here were corrected for surface roughness.
    • (1987) J. Electroanal. Chem. , vol.233
    • Rodríguez, J.F.1    Mebrahtu, T.2    Soriaga, M.P.3


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