X-ray absorption near-edge structure analysis of the chemical environment of zinc in the tribological film formed by zinc dialkyl dithiophosphate decomposition on steel

Tribology International

Volumn 38, Issue 2, 2005, Pages 195-204

  Pauli, M D ^a   Rufael, T S ^b   Mowlem, J K ^a   Weinert, M ^a   Saldin, D K ^a   Tysoe, W T ^a  

^a UNIVERSITY OF WISCONSIN MILWAUKEE   (United States)

^b Texaco Technology Division   (United States)

Author keywords

Cameron plint tribometer; Steel; Theoretical analysis; Tribological films; X ray absorption near edge fine structure (xanes); Zinc dialkyl dithiophosphate (zddp)

Indexed keywords

ABSORPTION; ADDITIVES; COMPUTER SIMULATION; DECOMPOSITION; GLASS; MONOLAYERS; OXIDATION; STEEL METALLOGRAPHY; X RAY ANALYSIS; X RAY SPECTROSCOPY;

CAMERON-PLINT TRIBOMETERS; THEORETICAL ANALYSIS; TRIBOLOGICAL FILMS; X-RAY ABSORPTION NEAR-EDGE FINE STRUCTURE (XANES); ZINC DIALKYL DITHIOPHOSPHATE (ZDDP);

TRIBOLOGY;

EID: 8844277800     PISSN: 0301679X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.triboint.2004.08.007     Document Type: Article

References (40)

1. Willermet PA, Dailey DP, Carter III RO, Schmitz PJ, Zhu W. Tribol Int 1995;28:177.
2. Bovington CH. In: Mortier RM, Orszulik ST, editors. Chemistry and technology of lubricants. London: Blackie; 1997 [Chapter 12].
3. Bird RJ, Galvin GP. Wear 1976;37:143.
4. Bird RJ, Coy RC, Hutton JF. ASLE Trans 1978;23:121.
5. Grossiord C, Martin JM, Le Mogne Th, Palermo Th. Tribol Lett 1999;6:171.
6. Varlot K, Martin JM, Grossiord C, Vargiolu R, Vacher B, Inoue K. Tribol Lett 1999;6:181.
7. Mowlem JK, Rufael TS. Private communication. Texaco Technology Division, Beacon, New York, 1998.
8. Varlot K, Kasrai M, Martin JM, Vacher B, Bancroft GM, Yamaguchi ES, et al. Tribol Lett 2000;8:9.
9. Graham JF, McCague C, Norton PR. Tribol Lett 1999;6:149.
10. Canning GW, Suominen Fuller ML, Bancroft GM, Kasrai M, Cutler JN, De Stasio G, et al. Tribol Lett 1999;6:159.
11. Speeding H, Watkins RC, Tribol Int 1982;15:9.
12. Coy RC, Jones RB. ASLE Trans 1979;24:77.
13. Martin JM. Tribol Lett 1999;6:1.
14. Suominen Fuller ML, Kasrai M, Bancroft GM, Fyfe K, Tan KH. Tribol Int 1998;31:627.
15. Yin Z. Ph.D. dissertation. University of Western Ontario, London, Canada, 1995.
16. Yin Z, Kasrai M, Fuller M, Bancroft GM, Fyfe K, Tan KH. Wear 1997;202:172.
17. Fuller M, Yin Z, Kasrai M, Bancroft GM, Yamaguchi ES, Ryason PR, et al. Tribol Int 1997;30:305.
18. Willermet PA, Dailey DP, Carter RO, Schmitz PJ, Zhu W, Ball JC, et al. Tribol Int 1995;28:163.
19. Wyckoff RWG. 2nd ed. Crystal structures vol. 1. New York: John Wiley & Sons; 1965.
20. Wimmer E, Krakauer H, Weinert M, Freeman AJ. Phys Rev B 1981;24:864; Weinert M, Wimmer E, Freeman AJ. Phys Rev B 1982;26:4571
21. Wimmer E, Krakauer H, Weinert M, Freeman AJ. Phys Rev B 1981;24:864; Weinert M, Wimmer E, Freeman AJ. Phys Rev B 1982;26:4571
22. Vvedensky DD, Saldin DK, Pendry JB. Comput Phys Commun 1986;40:421.
23. Durham PJ, Pendry JB, Hodges CH. Comput Phys Commun 1982;25:193.
24. Seah MP, Dench WA. Surf Interface Anal 1979;1:2.
25. Bearden JA, Burr AF. Rev Mod Phys 1967;39:125.
26. Cardona M, Ley L, editors. Photoemission in Solids I: General Principles with additional corrections. Berlin: Springer-Verlag; 1978.
27. Fuggle JC, Mårtensson N. J Electron Spectrosc Relat Phenom 1980;21:275.
28. Stohr J. NEXAFS Spectroscopy. New York: Springer-Verlag; 1996.
29. Shirley DA. Phys Rev B 1972;5:4709.
30. Weinert M, Davenport JW, Watson RE. Phys Rev B 1986;34:2971.
31. Kikuma J, Tonner BP. J Electron Spectrosc Relat Phenom 1996;82:53.
32. Van Hove MA, Weinberg WH, Chan C-M. Low-energy electron diffraction: experiment, theory and surface structure determination. New York: Springer-Verlag; 1986.
33. Whangbo S, Jang H, Kim S, Cho M, Jeong K, Whong C. J Korean Phys Soc 2000;37(4):456.
34. Lokhande BJ, Uplane MD. Appl Surf Sci 2000;167(3-4):243.
35. Natsume Y, Sakata H. Thin Solid Films 2000;372(1-2):30.
36. Nkum RK, Adimado AA, Totoe H. Mater Sci Eng B-Solid 1998;55(1-2):102.
37. Nam S, Yu Y-M, O B, Lee K-S, Choi YD, Jung Y-J. Appl Surf Sci 1999;151(3-4):203.
38. Ong HC, Chang RPH. Appl Phys Lett 2001;79(22):3612.
39. Ebina A, Fukunaga E, Takahashi T. Phys Rev B 1975;12(2):687.
40. Pearson RG. Chemical Hardness. New York: Wiley-VCH; 1996.