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Volumn 1, Issue , 2004, Pages 469-473

Performances of a high-speed impedance camera for flow informatics

Author keywords

Electrical impedance tomography; Flow measurement; High speed impedance camera; Performance

Indexed keywords

CAMERAS; CORRELATION METHODS; DATA ACQUISITION; ELECTRIC RESISTANCE; FLOW MEASUREMENT; SIGNAL PROCESSING; TOMOGRAPHY; VELOCITY MEASUREMENT;

EID: 8844276043     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/esda2004-58266     Document Type: Conference Paper
Times cited : (4)

References (8)
  • 2
    • 8844269089 scopus 로고    scopus 로고
    • A specific signal conditioner for electrical impedance tomography
    • Banff, Canada
    • Dai, Y., Ma, Y. and Wang, M., 2003, A specific signal conditioner for electrical impedance tomography, 3rd World Congress on Industrial Process Tomography, Banff, Canada, pp.45-49.
    • (2003) 3rd World Congress on Industrial Process Tomography , pp. 45-49
    • Dai, Y.1    Ma, Y.2    Wang, M.3
  • 4
    • 0028235499 scopus 로고
    • HIT image reconstruction using sensitivity weighted filtered back-projection
    • Al
    • Kotre, C. J., 1994, HIT image reconstruction using sensitivity weighted filtered back-projection, Physiol Meas. 15 Al, pp25-36.
    • (1994) Physiol Meas. , vol.15 , pp. 25-36
    • Kotre, C.J.1
  • 7
    • 0036142785 scopus 로고    scopus 로고
    • Inverse solutions for electrical impedance tomography based on conjugate gradients methods
    • Wang M., 2002, Inverse solutions for electrical impedance tomography based on conjugate gradients methods, Meas. Sci. & Tech., 13, pp. 101-117.
    • (2002) Meas. Sci. & Tech. , vol.13 , pp. 101-117
    • Wang, M.1
  • 8
    • 8844284407 scopus 로고    scopus 로고
    • A study on the characterization of air-water two-phase vertical flow by using electrical resistance imaging
    • Banff, Canada
    • Wu, Y., Li, H., Wang, M., and Williams, R.A., 2003, A study on the characterization of air-water two-phase vertical flow by using electrical resistance imaging, 3rd world Congress on Industrial Process Tomography, Banff, Canada, pp.516-521.
    • (2003) 3rd World Congress on Industrial Process Tomography , pp. 516-521
    • Wu, Y.1    Li, H.2    Wang, M.3    Williams, R.A.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.